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Near-field infrared microscopy of nanometer-sized nickel clusters inside single-walled carbon nanotubes

Gergely Németh, Dániel Datz, Áron Pekker, Takeshi Saito, Oleg Domanov, Hidetsugu Shiozawa, Sándor Lenk, Béla Pécz, Pál Koppa, Katalin Kamarás
RSC Advances 9 34120–34124

AFM topography (left) and optical near-field phase map (right) of Ni clusters grown inside carbon nanotubes. Metallic Ni clusters "glow" in infrared light.
AFM topography (left) and optical near-field phase map (right) of Ni clusters grown inside carbon nanotubes. Metallic Ni clusters "glow" in infrared light.
© RSC Advances

  Nickel nanoclusters grown inside single-walled carbon nanotubes (SWCNT) were studied by infrared scattering-type scanning near-field optical microscopy (s-SNOM). The metal clusters give high local contrast enhancement in near-field phase maps caused by the excitation of free charge carriers. The experimental results are supported by calculations using the finite dipole model, approximating the clusters with elliptical nanoparticles. Compared to magnetic force microscopy, s-SNOM appears much more sensitive to detect metal clusters inside carbon nanotubes. We estimate that these clusters contain fewer than  ~700 Ni atoms.


További információ: https://doi.org/10.1039/C9RA07089C

Beküldte: Kamarás Katalin, 2019. 11. 04. 16.22,   Hír típusa: Cikk,   Megtekintve: 1551 alkalommal