NewView™ 7100

The NewView™ 7100 white light interferometer (profilometer) provides affordable versatility in non-contact optical surface profiling. With powerful tools for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy, all measurements are nondestructive, fast, and require no sample preparation. Profile heights ranging from < 1 nm up to 20000 µm, at high speeds, independent of surface texture, magnification, or feature height!
Using ZYGO's Coherence Scanning Interferometry (CSI) technology, the NewView™ 7100 3D optical surface profiler easily measures a wide range of surfaces, including smooth, rough, flat, sloped, and stepped surfaces.
Performance, Value, and Versatility
The NewView 7100 offers high-accuracy measurements, ease of use, and a wide variety of applications all at an attractive price point that make it the ideal choice for affordable versatility in 3D optical profilers.

Key Features:
• Fast non-contact measurements
• Sub-angstrom Z resolution
• Leading-edge precision & gage capability
• Enhanced optical imaging